We have accepted the following proposals for the SACLA/SPring-8 Basic Development Program 2026.

1. Title：Development of time-resolved resonant ARPES system toward SPring-8 II
Category：B (Continued proposal)
Name of PI：FUJIWARA Hidenori (Osaka University, Assistant Professor)
Participants Affiliation：Osaka University, RIKEN

2. Title：Development of High-throughput Quick XAFS Measurement System by
   Synchronous On-the-fly scan of Monochromator and ID gap
Category：B (Continued proposal)
Name of PI：ISHIGURO Nozomu (Tohoku University, Associate Professor)
Participants Affiliation：None

3. Title：Development of Dynamic Coherent X-ray Diffraction Imaging System Using
   Next-Generation Image Detector CITIUS
Category：B (Continued proposal)
Name of PI：TAKAHASHI Yukio (Tohoku University, Professor)
Participants Affiliation：Tohoku University, Osaka University,
Japan Advanced Institute of Science and Technology

4. Title：Construction of a high-precision single-crystal X-ray diffraction measurement and
    analysis system under electric fields
Category：A (New proposal)
Name of PI：KITOU Shunsuke (The University of Tokyo, Assistant Professor)
Participants Affiliation：Nagoya University, The University of Tokyo, Tohoku University, JASRI

5. Title：Developing universal methods for determining the time-zero at the soft X-ray free
    electron laser beamtime
Category：B (Continued proposal)
Name of PI：MATSUDA Iwao (The University of Tokyo, Professor)
Participants Affiliation：The University of Tokyo

6. Title：Development of EUV-FEL nanofocusing mirror system with diffraction-limited accuracy
Category：A (New proposal)
Name of PI：YAMADA Jumpei (Osaka University, Associate Professor)
Participants Affiliation：Osaka University

7. Title：Upgrading of high pressure research beamline for precise structural analysis under
    extreme conditions
Category：A (New proposal)
Name of PI：NIWA Ken (Nagoya University, Associate Professor)
Participants Affiliation：JASRI, The University of Tokyo, Nagoya University

8. Title：Evaluation of CITIUS Detector in Soft X-ray Measurements and Its Application to Soft
    X-ray Microscopies accuracy
Category：A (New proposal)
Name of PI：KIMURA Takashi (The University of Tokyo, Associate Professor)
Participants Affiliation：The University of Tokyo